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ISP NAS of Ukraine


  1. A.N. Nazarov, I.N. Osiyuk, V.S. Lysenko, T. Gebel, L. Rebohle and W. Skorupa Charge trapping and degradation in Ge+ ion implanted SiO2 layers during high-field injection Microelectronics Reliability, vol.42, pp.1461-1464 (2002)

  2. T. Gebel, L. Rebohle, W. Skorupa, A.N. Nazarov, I.N. Osiyuk, and V.S. Lysenko Charge trapping in light-emitting SiO2 layers implanted with Ge+ ions Appl. Phys. Lett., vol.81, pp.2575-2576 (2002)

  3. V.S. Lysenko, I.P. Tyagulski, I.N. Osiyuk and Y.V. Gomeniuk Cryogenic investigations of SIMOX buried oxide parameters. In: Progress in SOI Structures and Devices Operating at Extreme Conditions NATO ASI Series II (ed. by F.Balestra et al.), vol.58, Kluwer Academic Publishers, Dordrecht, pp. 159-166 (2002)

  4. T. Rudenko, V. Kilchytska, J.-P. Colinge, V. Dessard, D. Flandre On the high-temperature subthreshold slope in thin-film SOI MOSFETs IEEE Electron. Device Lett. vol.23, No.3, pp.148-150 (2002)

  5. Ja. Vovk, A. Nazarov, V. Lysenko, O. Konkov, E. Terukov Study of Er-related defects in a-Si:H(Er)/c-n-Si heterostructures by thermally activated current spectroscopy Physica B, vol.308-310, pp.382-386 (2001)

  6. A.V. Vasin, L.A. Matveeva, V.O. Yukhymchuk Photoluminescence of the amorphous carbon in the a-C:C60 films prepared by deposition of the fullerene C60 Technical Physics Letters 28(7) pp. 592-594 (2002)