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ISP NAS of Ukraine


  1. H.Ö. Ólafsson, E.Ö. Sveinbjörnsson, T.E. Rudenko, I.P. Tyagulski, I.N. Osiyuk, V.S. Lysenko Border traps in 6H-SiC metal-oxide-semiconductor capacitors investigated by the thermally-stimulated current technique Applied Physics Letters, vol.79, No.24, pp.4034-4036 (2001)

  2. A.N. Nazarov, Ja.N. Vovk, V.S. Lysenko, V.I. Turchanikov, V.A. Scryshevskii and S. Ashok Carrier transport in amorphous SiC/ crystalline silicon heterojunctions Journal of Applied Physics, vol.89, No.8, pp.4422-4428, (2001)

  3. V.S. Lysenko, I.P. Tyagulski, Y.V. Gomeniuk, I.N. Osiyuk Effect of oxide-semiconductor interface traps on low-temperature operation of MOSFETs Phys. Quantum Electronics and Optoelectronics, vol.4, No.2, pp.75-81 (2001)

  4. A.N. Nazarov, V.M. Pinchuk, T.V. Yanchuk, V.S. Lysenko, Ya.N. Vovk, S. Rangan, S. Ashok, V. Kudoyarova, E.I. Terukov Hydrogen effect on enhancement of defect reactions in semiconductors: example for silicon and vacancy defects International Journal of Hydrogen Energy, vol.26, pp.521526 (2001)

  5. V.S. Lysenko, A.N. Nazarov, V.I. Kilchytska, I.N. Osiyuk, I.P. Tyagulskii, Y.V. Gomenyuk, I.P. Barchuk Thermally activated processes in the buried oxide of SIMOX SOI structures and devices Solid-State Electronics, vol.45. -No.4. -pp.575-584 (2001)