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  1. T.E. Rudenko, V.I. Kilchitskaya, A.N. Rudenko Diffusion model for high-temperature off-state currents in SOI MOSFETs Microelectronic Engineering, vol.36, No.(1-4), pp.367-370 (1997)

  2. I.P. Barchuk, V.I. Kilchitskaya, V.S. Lysenko, A.N. Nazarov, T.E. Rudenko, S.V. Djurenko, A.N. Rudenko, A.P. Yurchenko, D. Ballutaud and J.-P. Colinge Electrical Properties and Radiation Hardness of SOI Systems with Multilayer Buried Dielectric IEEE Transactions on Nuclear Science, vol.44, No.6, pp.2542-2552 (1997)

  3. V.S. Lysenko, Y.V. Gomeniuk, I.P. Tyagulskii, I.N. Osiyuk, V.Z. Lozovski, V.N. Varyukhin Flux pinning under the strong electrostatic field in the BiPbSrCaCuO film Physica C, vol.281, No.4, pp.303-309 (1997)

  4. A.N. Nazarov, J.-P. Colinge and I.P. Barchuk Research of high-temperature instability processes in buried dielectric of full depleted SOI MOSFETs Microelectronic Engineering, vol.36, pp.363-366 (1997)