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Publications1995

  1. T.E. Rudenko, A.N. Rudenko, A.N. Nazarov and V.S. Lysenko Characterization of SOI by capacitance and current measurements with combined gated diode and depletion-mode MOSFET structure Microelectronic Engineering, vol.28, pp.475-478 (1995)

  2. V.S. Lysenko, Y.V. Gomeniuk, V.Z. Lozovski, I.N. Osiyuk, I.P. Tyagulski, V.N. Varyukhin Dissipation behaviour and critical currents under the strong electrostatic field in the BiPbSrCaCuO thin film Proc. of Symposium on Low Temperature Electronics and High Temperature Superconductivity, Reno, Nevada, 21-26 May, The Electrochem. Soc. Inc., Pennington, pp.148-154 (1995)

  3. V.S. Lysenko, Y.V. Gomeniuk, I.N. Osiyuk, I.P. Tyagulskii Investigation of traps in the nSiC-pSi interface at cryogenic temperatures Microelectronic Engineering, vol.28, pp.205-208 (1995)