- T.E. Rudenko, V.I. Kilchitskaya, A.N. Rudenko Diffusion model for high-temperature off-state currents in SOI MOSFETs Microelectronic Engineering, vol.36, No.(1-4), pp.367-370 (1997)
- I.P. Barchuk, V.I. Kilchitskaya, V.S. Lysenko, A.N. Nazarov, T.E. Rudenko, S.V. Djurenko, A.N. Rudenko, A.P. Yurchenko, D. Ballutaud and J.-P. Colinge Electrical Properties and Radiation Hardness of SOI Systems with Multilayer Buried Dielectric IEEE Transactions on Nuclear Science, vol.44, No.6, pp.2542-2552 (1997)
- V.S. Lysenko, Y.V. Gomeniuk, I.P. Tyagulskii, I.N. Osiyuk, V.Z. Lozovski, V.N. Varyukhin Flux pinning under the strong electrostatic field in the BiPbSrCaCuO film Physica C, vol.281, No.4, pp.303-309 (1997)
- A.N. Nazarov, J.-P. Colinge and I.P. Barchuk Research of high-temperature instability processes in buried dielectric of full depleted SOI MOSFETs Microelectronic Engineering, vol.36, pp.363-366 (1997)
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