Department of Functional Materials, Nanosized Structures and Devices
V. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
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1983
R.N. Litovskii, V.S. Lysenko, A.N. Nazarov, T.E. Rudenko, S.B. Kaschieva, and N.R. Nedev
The Influence of Defect Surface Layers on the Capacitive Properties of MOS Structures
Phys. Stat. Sol. (a) vol.77, pp.699-707 (1983)